Scanning Electron Microsope (EVO-18)

• EVO 18 can handle specimens of up to 250mm in diameter and 145mm in height.

• Variable pressure functionality that comes as standard can also analyze non-conductive samples with minimal sample preparation.

• EDS using EDAX database is attached with this SEM

• Operations: particle analysis, Surface analysis, BSD structure analysis, Qualitative microanalysis, Quantitative microanalysis, X-ray area mapping, Line Scan (line mapping). Provides information on the sample's surface and its composition, examination and analysis of micro- and nanoparticle imaging characterization of solid objects, micrograph of fractured surfaces.

• Application: Micro- and nanoscale characterization of topography, composition and phases.Observation of Surface Morphology of Materials, Observation of Material Interface, Observation of material fracture, Semiconductor Applications.

Instructions for performing SEM, EDS X-RAY Microanalysis:

• Solid samples, e.g., Metallic, Amorphous, coated sample or thin films etc.

• Dimension:    10x10mm or larger

• The sample must be properly cleaned before observation.

• Non conducting samples must be gold coated.

•  The state of the samples must be specified in the booking form.

• The operator is not responsible for any data analysis.

Field Emission Scanning Electron Microscope (SUPRA-40) 

Specifications:

• Model o.: SUPRA-40 make Carl Zeiss

• Magnification: 12-10,00,000 x

• Emitter: Thermal field emission type with acceleration voltage of 1.5-30kV

• Standard Detectors: ZEISS High efficiency In-lens detector, ZEISS Everhart-Thornley Secondary Electron Detector, Back Scattered Detector, Oxford EDS Detector

Utility: Operations include High Magnification particle analysis, Surface analysis, BSD structure analysis, Qualitative microanalysis, Quantitative microanalysis, X-ray area mapping, Line Scan (line mapping)

Application:

•   Micro- and nanoscale characterization of topography, composition and phases.

•   Observation of Surface Morphology of Materials

•   Observation of Material Interface

•  Observation of material fracture

Instructions for performing SEM, EDS X-RAY Microanalysis:

•   Solid samples, e.g., Metallic, Amorphous, coated sample or thin films etc.

•   Dimension:    10x10mm or larger

•  The sample must be properly cleaned before observation.

•    Non conducting samples must be gold coated.

•    Powder samples must be compacted.

•   No organic/volatile samples would be allowed.

•   Liquid samples are not allowed. Only solid biological samples may be allowed.

•  The state of the samples must be specified in the booking form.

•  The operator is not responsible for any data analysis.